Particle Characterisation

Beckman Coulter Delsa^TM Nano Zeta Potential and Sub micron Particle Size Analyzer

A New Generation of PCS and ELS Instruments

Zeta Potential Distribution Measurement of Concentrated Suspensions
This is the first instrument in the industry that measures zeta potential distribution of concentrated solutions using ELS. It uses the patent-pending forward scattering through transparent electrode technology (FST) to measure zeta potential of particles in various suspension concentrations up to 10 percent or higher depending on particle size.The FST is the only known technology that can measure zeta potential of particles in concentrated suspensions.

Zeta Potential Measurement of Solid Surfaces or Films
This is the first in the industry that measures zeta potential of solid surfaces or films using ELS. Surface charge or zeta potential of bare, treated, or coated solid surfaces or film such as glass, metal, metal oxide, ceramics, etc. in liquid can be measured using DelsaNano. A unique approach in DelsaNano makes these measurements possible.

Product Features

• Size Range – 0.6 to7000 nm
  
• Size Range for Zeta Potential – 0.6 – 30,000 nm
  
• Mobility: ± 1.2 10^ˉ3cm²/V.s
  
• Zeta Potential: ± 150 mV
  
• Molecular Weight: 10³- 3 X 10⁷ Daltons
  
• Concentration range: 0.001% to 40%.
  
• Patent-pending FST technology
  
• Fully automatic pH or additive titration for both size and zeta potential measurement
• Zeta potential measurement of solid surface or film
  

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